X-Ray Diffraction Table |
See Help on X-Ray Diffraction.
Powder X-ray Diffraction (XRD) is one of the primary techniques used by mineralogists and solid state chemists to examine the physico-chemical make-up of unknown materials. This data is represented in a collection of single-phase X-ray powder diffraction patterns for the three most intense D values in the form of tables of interplanar spacings (D), relative intensities (I/Io), mineral name and chemical formulae
The XRD technique takes a sample of the material and places a powdered sample in a holder, then the sample is illuminated with x-rays of a fixed wave-length and the intensity of the reflected radiation is recorded using a goniometer. This data is then analyzed for the reflection angle to calculate the inter-atomic spacing (D value in Angstrom units - 10-8 cm). The intensity(I) is measured to discriminate (using I ratios) the various D spacings and the results are compared to this table to identify possible matches. Note: 2 theta (Θ) angle calculated from the Bragg Equation, 2 Θ = 2(arcsin(n λ/(2d)) where n=1
For more information about this technique, see X-Ray Analysis of a Solid or take an internet course at Birkbeck College On-line Courses. Many thanks to Frederic Biret for these data.
[ 1 ]
D1 Å (2θ) |
I1 %) |
D2 Å (2θ) |
I2 (%) |
D3 Å (2θ) |
I3 (%) |
Mineral | Formula |
2.758(32.44) | 100 | 3.266(27.28) | 100 | 3.434(25.92) | 100 | Oxyvanite | V3O5 |
2.772(32.27) | 200 | 5.500(16.10) | 200 | 5.760(15.37) | 140 | Olkhonskite | (Cr+++,V+++)2Ti3O9 |
2.776(32.22) | 200 | 8.540(10.35) | 200 | 4.380(20.26) | 180 | Jeremejevite | Al6B5O15(F,OH)3 |
2.780(32.17) | 200 | 4.820(18.39) | 200 | 21.600(4.09) | 200 | Glucine | CaBe4(PO4)2(OH)4ยท0.5(H2O) |
2.782(32.15) | 200 | 4.780(18.55) | 174 | 5.356(16.54) | 142 | Zincostaurolite | [ ]4Zn4Al16(Al,[ ])2Si8O40[O6,(OH)2] |
2.800(31.94) | 200 | 2.980(29.96) | 200 | 4.980(17.80) | 100 | Leadamalgam | HgPb2 |
[ 1 ]