Mineralogy Database

X-Ray Diffraction Table

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Minerals Arranged by X-Ray Powder Diffraction

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Powder X-ray Diffraction (XRD) is one of the primary techniques used by mineralogists and solid state chemists to examine the physico-chemical make-up of unknown materials. This data is represented in a collection of single-phase X-ray powder diffraction patterns for the three most intense D values in the form of tables of interplanar spacings (D), relative intensities (I/Io), mineral name and chemical formulae

The XRD technique takes a sample of the material and places a powdered sample in a holder, then the sample is illuminated with x-rays of a fixed wave-length and the intensity of the reflected radiation is recorded using a goniometer. This data is then analyzed for the reflection angle to calculate the inter-atomic spacing (D value in Angstrom units - 10-8 cm). The intensity(I) is measured to discriminate (using I ratios) the various D spacings and the results are compared to this table to identify possible matches. Note: 2 theta (Θ) angle calculated from the Bragg Equation, 2 Θ = 2(arcsin(n λ/(2d)) where n=1

For more information about this technique, see X-Ray Analysis of a Solid or take an internet course at Birkbeck College On-line Courses.  Many thanks to Frederic Biret for these data.

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Found 6 Records, Sorted by D1 using 1.54056 - CuKa1 for 2θ WHERE (d1 > 2.88708 AND d1 < 3.00492)
D1
Å (2θ)
I1
%)
D2
Å (2θ)
I2
(%)
D3
Å (2θ)
I3
(%)
Mineral Formula
2.970(30.06) 200 19.540(4.52) 200 6.340(13.96) 200 Brammallite (Na,H3O)(Al,Mg,Fe)2(Si,Al)4O10[(OH)2,(H2O)]
2.972(30.04) 200 4.100(21.66) 200 4.300(20.64) 200 Niggliite PtSn
2.974(30.02) 200 3.186(27.98) 200 5.800(15.26) 180 Shuiskite Ca2(Mg,Al)(Cr,Al)2(SiO4)(Si2O7)(OH)2·(H2O)
2.988(29.88) 200 5.840(15.16) 160 16.600(5.32) 120 Chrysocolla (Cu,Al)2H2Si2O5(OH)4·n(H2O)
2.990(29.86) 200 2.408(37.31) 180 5.660(15.64) 140 Luanheite Ag3Hg

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