Mineralogy Database

X-Ray Diffraction Table

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Minerals Arranged by X-Ray Powder Diffraction

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Powder X-ray Diffraction (XRD) is one of the primary techniques used by mineralogists and solid state chemists to examine the physico-chemical make-up of unknown materials. This data is represented in a collection of single-phase X-ray powder diffraction patterns for the three most intense D values in the form of tables of interplanar spacings (D), relative intensities (I/Io), mineral name and chemical formulae

The XRD technique takes a sample of the material and places a powdered sample in a holder, then the sample is illuminated with x-rays of a fixed wave-length and the intensity of the reflected radiation is recorded using a goniometer. This data is then analyzed for the reflection angle to calculate the inter-atomic spacing (D value in Angstrom units - 10-8 cm). The intensity(I) is measured to discriminate (using I ratios) the various D spacings and the results are compared to this table to identify possible matches. Note: 2 theta (Θ) angle calculated from the Bragg Equation, 2 Θ = 2(arcsin(n λ/(2d)) where n=1

For more information about this technique, see X-Ray Analysis of a Solid or take an internet course at Birkbeck College On-line Courses.  Many thanks to Frederic Biret for these data.

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Found 4 Records, Sorted by D1 using 1.54056 - CuKa1 for 2θ WHERE (d1 > 2.6656 AND d1 < 2.7744)
Å (2θ)
Å (2θ)
Å (2θ)
Mineral Formula
2.669(33.55) 200 4.486(19.77) 180 7.032(12.58) 180 Baotite Ba4(Ti,Nb)8Si4O28Cl
2.750(32.53) 200 6.460(13.70) 200 7.100(12.46) 200 Julienite Na2Co++(SCN)4ยท8(H2O)
2.758(32.44) 100 3.266(27.28) 100 3.434(25.92) 100 Oxyvanite V3O5
2.772(32.27) 200 5.500(16.10) 200 5.760(15.37) 140 Olkhonskite (Cr+++,V+++)2Ti3O9

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