Powder X-ray Diffraction (XRD) is one of the primary techniques used by mineralogists and solid state chemists to examine the physico-chemical make-up of unknown solids. This data is represented in a collection of single-phase X-ray powder diffraction patterns for the three most intense D values in the form of tables of interplanar spacings (D), relative intensities (I/Io), and mineral name.
The XRD technique takes a sample of the material and places a powdered sample in a holder, then the sample is illuminated with x-rays of a fixed wave-length and the intensity of the reflected radiation is recorded using a goniometer. This data is then analyzed for the reflection angle to calculate the inter-atomic spacing (D value in Angstrom units - 10-8 cm). The intensity(I) is measured to discriminate (using I ratios) the various D spacings and the results are to identify possible matches.
Search X-Ray Diffraction Table
Users can now search on D1, D2, D3, and chemical formula in any order from the Table of X-Ray spacing. The search is based on reported values from each mineral where a diffraction file has been published. Two theta values can be calculated for different wavelengths based on commonly used X-Ray anode values. In addition, the user can input any value for X-Ray wavelength and the 2 theta angles are calculated for that wavelength.
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